文献
J-GLOBAL ID:201702214065088216
整理番号:17A0238396
28nm FD-SOIプロセッサSoCにおけるオンチップ供給電力測定と波形再構成【Powered by NICT】
On-chip supply power measurement and waveform reconstruction in a 28nm FD-SOI processor SoC
著者 (9件):
Cochet Martin
(STMicroelectronics, Crolles, France)
,
Puggelli Alberto
(Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA, USA)
,
Keller Ben
(Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA, USA)
,
Zimmer Brian
(Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA, USA)
,
Blagojevic Milovan
(STMicroelectronics, Crolles, France)
,
Clerc Sylvain
(STMicroelectronics, Crolles, France)
,
Roche Philippe
(STMicroelectronics, Crolles, France)
,
Autran Jean-Luc
(Aix-Marseille University & CNRS, IM2NP (UMR 7334), Marseille, France)
,
Nikolic Borivoje
(Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA, USA)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2016
号:
A-SSCC
ページ:
125-128
発行年:
2016年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)