文献
J-GLOBAL ID:201702218287784853
整理番号:17A0852223
外挿による負バイアス温度不安定性の長期予測のための信頼性のある時間指数【Powered by NICT】
Reliable Time Exponents for Long Term Prediction of Negative Bias Temperature Instability by Extrapolation
著者 (13件):
Gao Rui
(School of Engineering, Liverpool John Moores University, Liverpool, U.K.)
,
Manut Azrif B.
(School of Engineering, Liverpool John Moores University, Liverpool, U.K.)
,
Ji Zhigang
(School of Engineering, Liverpool John Moores University, Liverpool, U.K.)
,
Ma Jigang
(School of Engineering, Liverpool John Moores University, Liverpool, U.K.)
,
Duan Meng
(School of Engineering, Liverpool John Moores University, Liverpool, U.K.)
,
Zhang Jian Fu
(School of Engineering, Liverpool John Moores University, Liverpool, U.K.)
,
Franco Jacopo
(imec, Leuven, Belgium)
,
Hatta Sharifah Wan Muhamad
(Department of Electrical Engineering, University of Malaya, Kuala Lumpur, Malaysia)
,
Zhang Wei Dong
(School of Engineering, Liverpool John Moores University, Liverpool, U.K.)
,
Kaczer Ben
(imec, Leuven, Belgium)
,
Vigar David
(Qualcomm Technologies International Ltd., Cambridge, U.K.)
,
Linten Dimitri
(imec, Leuven, Belgium)
,
Groeseneken Guido
(imec, Leuven, Belgium)
資料名:
IEEE Transactions on Electron Devices
(IEEE Transactions on Electron Devices)
巻:
64
号:
4
ページ:
1467-1473
発行年:
2017年
JST資料番号:
C0222A
ISSN:
0018-9383
CODEN:
IETDAI
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)