文献
J-GLOBAL ID:201702277215825639
整理番号:17A0457543
GHOGと低ランク回復に基づく新しい模様のある布地の欠陥検出アルゴリズム【Powered by NICT】
A novel patterned fabric defect detection algorithm based on GHOG and low-rank recovery
著者 (5件):
Gao Guangshuai
(School of Electric and Information Engineering, Zhongyuan Uniersity of Technology, Zhengzhou, Henan, 450007, China)
,
Zhang Duo
(School of Computer Science, Beijing Institute of Technology, Beijing 100081, China)
,
Li Chunlei
(School of Electric and Information Engineering, Zhongyuan Uniersity of Technology, Zhengzhou, Henan, 450007, China)
,
Liu Zhoufeng
(School of Electric and Information Engineering, Zhongyuan Uniersity of Technology, Zhengzhou, Henan, 450007, China)
,
Liu Qiuli
(School of Electric and Information Engineering, Zhongyuan Uniersity of Technology, Zhengzhou, Henan, 450007, China)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2016
号:
ICSP
ページ:
1118-1123
発行年:
2016年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)