文献
J-GLOBAL ID:202102257308425088
整理番号:21A3280489
電気光学サンプリングによる相対論的ピコ秒電子バンチの空間-時間プロファイル診断の研究【JST・京大機械翻訳】
Study of the spatio-temporal profile diagnostics for relativistic picosecond electron bunches by electro-optic sampling
著者 (10件):
Ota M.
(Osaka University,Institute of Laser Engineering,Osaka,Japan,565-0871)
,
Kan K.
(Osaka University,The Institute of Scientific and Industrial Research,Osaka,Japan,567-0047)
,
Komada S.
(Mie University,Department of Electrical and Electronic Engineering,Tsu, Mie,Japan,514-8507)
,
Arikawa Y.
(Osaka University,Institute of Laser Engineering,Osaka,Japan,565-0871)
,
Mag-Usara V. K.
(Osaka University,Institute of Laser Engineering,Osaka,Japan,565-0871)
,
Agulto V. C.
(Osaka University,Institute of Laser Engineering,Osaka,Japan,565-0871)
,
Wang Y.W.
(Osaka University,Institute of Laser Engineering,Osaka,Japan,565-0871)
,
Sakawa Y.
(Osaka University,Institute of Laser Engineering,Osaka,Japan,565-0871)
,
Matsui T.
(Mie University,Department of Electrical and Electronic Engineering,Tsu, Mie,Japan,514-8507)
,
Nakajima M.
(Osaka University,Institute of Laser Engineering,Osaka,Japan,565-0871)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2021
号:
IRMMW-THz
ページ:
1-2
発行年:
2021年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)