Rchr
J-GLOBAL ID：200901024624214182
Update date: May. 17, 2020
Kume Eiji
クメ エイジ | Kume Eiji
Affiliation and department：
National Institute of Advanced Industrial Science and Technology
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Homepage URL (1)：
http://www.aist.go.jp/RESEARCHERDB/cgi-bin/worker_detail.cgi?call=namae&rw_id=E08304198
MISC (9)：
E Kume, S Sakai. Properties of a dielectric probe for scanning near-field millimeter-wave microscopy. JOURNAL OF APPLIED PHYSICS. 2006. 99. 5. 056105-1-056105-3
C Wang, M Takahashi, H Fujino, Zhao, X, E Kume, T Horiuchi, S Sakai. Leakage current of multiferroic (Bi0.6Tb0.3La0.1)FeO3 thin films grown at various oxygen pressures by pulsed laser deposition and annealing effect. JOURNAL OF APPLIED PHYSICS. 2006. 99. 5. 054104-1-054104-5
H Fujino, E Kume, S Sakai. Face-to-face annealing of Bi2Sr2CaCu2Ox thin films for intrinsic Josephson junctions with uniform critical currents. PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS. 2005. 426. Part2. 1474-1478
Zhao, X, S Sakai, H Fujino, E Kume. Resonant characteristics of twofold Josephson junctions with various critical current ratio. PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS. 2004. 412. P2. 1468-1472
H Fujino, E Kume, E Sugimata, Zhao, X, S Sakai. Characteristics of intrinsic Josephson junctions using a Bi2Sr2CaCu2Ox thin film estimated overall in a chip. PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS. 2004. 412. P2. 1410-1413
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