Rchr
J-GLOBAL ID：200901025978432647
Update date: Apr. 30, 2020
Hyon Chankyeong
ヒョン チャンキョン | Hyon Chankyeong
Affiliation and department：
Japan Science and Technology Agency
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Research theme for competitive and other funds (1)：
Carbon nanotube electronic device
MISC (3)：
C Hyon, S Oh, H Kim, S Sull, S Hwang, D Ahn, Y Park, E Kim. An automated glitch-detection/restoration method of atomic force microscope images. REVIEW OF SCIENTIFIC INSTRUMENTS. 2002. 73. 9. 3245-3250
HYON C K, CHOI S C, SONG S-H, HWANG S W, SON M H, AHN D, PARK Y J, KIM E K. Application of atomic-force-microscope direct patterning to selective positioning of InAs quantum dots on GaAs. Appl. Phys. Lett. 2000. 77. 16. 2607-2609
HYON C K, CHOI S C, HWANG S W, AHN D, KIM Y, KIM E K. Direct nanometer-scale patterning by the cantilever oscillation of an atomic force microscope. Appl. Phys. Lett. 1999. 75. 2. 292-294
Education (2)：
- 2002 高麗大學校 電子科学研究科 Semiconductor
高麗大學校 電気通信学部 Electronics
Professional career (1)：
Ph. D. (高麗大學校)
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