Improvement of Isothermal Capacitance Transient Spectroscopy for Deep Level Measurement Including Interface Trap
Semiconductor Characterization : Present Status and Future Needs 1996
Education (4):
- 1968 Kobe University
- 1968 Kobe University Graduate School, Division of Engineering
- 1966 Himeji Institute of Technology
- 1966 Himeji Institute of Technology Faculty of Engineering
Professional career (2):
Dr. Eng. (Osaka University)
M. Eng. (Kobe University)
Work history (5):
1986 - 1993 Himeji Institute of Technology
1986 - 1993 Himeji Institute of Technology, Lecturer
1968 - 1986 Himeji Institute of Technology
1968 - 1986 Himeji Institute of Technology, Research
Assistant
Association Membership(s) (4):
日本材料学会
, Materials Research Society
, 日本物理学会
, 応用物理学会