Research keywords (6):
ライン検査
, 電子部品
, 画像処理
, Line inspection
, Electronic products
, Image processing
Research theme for competitive and other funds (2):
2001 - 2004 Research on image processing inspection of electronic products
2001 - 電子部品の画像処理検査についての研究
Works (6):
電子部品検査自動化のための画像処理基礎と応用について
2001 - 2002
Image-processing foundation for electronic product inspection automation, and the research on application.
2001 - 2002
Visual Inspection PC System for Quality Control of Electronec Devises(共著)H. Koshimizu and T. Watanabe Proc.SPIE2002 ( 2002 ) 165-173
Inspection System for 3D Defects of Electronic Devices by Means of Depth from Focus Method(共著)Hiroyasu. Koshimizu, Takashi Watanabe Proc.of FCV2002(Sapporo, Japan) ( 2002 )
Visual Inspection PC System for Quality Control of Electronec Devises(Joint research person)H. Koshimizu and T. Watanabe Proc.SPIE2002 ( 2002 ) 165-173