Rchr
J-GLOBAL ID：200901029125177952   Update date: Feb. 08, 2023

Tsukimoto Isao

ツキモト イサオ | Tsukimoto Isao
Affiliation and department：
National Institute of Technology, Kagawa College Department of Electronic Systems Engineering

About National Institute of Technology, Kagawa College Department of Electronic Systems Engineering


Job title： Research Assistant
Research field  (1)： Electronic devices and equipment
Research keywords  (4)： 電源電流 ,  回路テスト ,  故障検出 ,  電子回路
Research theme for competitive and other funds  (2)：
  • 1989 - 2010 論理回路の電流テスト法に関する研究
  • -
Papers (8)：
  • Masaki Hashizume, Yuki Ikiri, Tomoaki Konishi, Hiroyuki Yotsuyanagi, Shyue-Kung Lu. Electrical interconnect test of solder joint part with boundary scan flip flops and a built-in test circuit. Journal of Japan Institute of Electronics Packaging. 2016. 19. 3. 161-165
  • Akira Ono, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Masao Takagi, Masaki Hashizume. Open lead detection method by sensing the switching current of CMOS gate on sensing probe. Journal of Japan Institute of Electronics Packaging. 2009. 12. 2. 137-143
  • Masao Takagi, Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi. Applied AC Voltage for Detecting Open Leads of CMOS LSI by Monitoring Supply Current under AC Electric Field. Journal of The Japan Institute of Electronics Packaging. 2007. 10. 3. 219-228
  • Isao Tsukimoto, Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada. Statistical Supply Current Test Method for Opens in TTL Circuits with IC Characteristics Variations. Journal of The Japan Institute of Electronics Packaging. 2005. 8. 3. 199-207
  • Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Takeomi Tamesada. Electric field for detecting open leads in CMOS logic circuits by supply current testing. Proceedings - IEEE International Symposium on Circuits and Systems. 2005. 2995-2998
ｍore...
MISC (51)：
  • 境 直人, 月本 功. Fault judgement based on variance in the test method by measuring quiescent supply current for detecting open faults. Abstract book of Malaysia-Japan International Conference on Nanoscience, Nanotechnology and Nanoengineering 2021. 2021. 19-19
  • 安藤 健太, 月本 功. 電流テスト法における電磁誘導による断線故障検出の基礎的検討. 令和2年度電気・電子・情報関係学会四国支部連合大会講演論文集. 2020. 9-1-9-1
  • 月本 功, 安藤 健太, 須崎 晴登. LSI実装時半断線故障に対する電流テストによる検出可能性の評価. 独立行政法人国立高等専門学校機構香川高等専門学校研究紀要第10号. 2019. 107-111
  • 須崎晴登, 月本 功. Effectiveness of supply current test method for resistive open fault by miniaturization of manufacturing process. Abstract book of The 14th Eco-Energy and Materials Science and Engineering Symposium 2018. 2018. 75-75
  • 須崎晴登, 月本 功, 四柳浩之, 橋爪正樹. 電流テスト法によるLSI実装時半断線故障の検出可能性評価. 平成29年度電気関係学会四国支部連合大会講演論文集. 2017. 79-79
ｍore...
Patents (2)：
  • プリント基板の実装構造
  • ごみ焼却炉の燃え切り点検出方法及び装置
Education (3)：
  • - 2011 The University of Tokushima Graduate School of Engineering
  • - 1992 The University of Tokushima Graduate School of Engineering
  • - 1990 The University of Tokushima Faculty of Engineering
Professional career (1)：
  • 博士(工学) (徳島大学)
Work history (2)：
  • 2009/10 - 現在 National Institute of Technology, Kagawa College Department of Electronic Systems Engineering
  • 2002/04 - 2009/09 詫間電波高等専門学校 電子工学科
Association Membership(s) (2)：
エレクトロニクス実装学会 ,  電気情報通信学会
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