Rchr
J-GLOBAL ID：200901029696955570
Update date: Apr. 12, 2020
Nikawa Kiyoshi
ニカワ キヨシ | Nikawa Kiyoshi
Affiliation and department：
Job title：
Specially Appointed Professor
Research field (2)：
Measurement engineering
, Electronic devices and equipment
Research keywords (4)：
信頼性工学
, 非破壊解析
, 故障解析
, LSI
Research theme for competitive and other funds (1)：
Papers (2)：
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Kiyoshi Nikawa, Masatsugu Yamashita, Toru Matsumoto, Katsuyoshi Miura, Yoshihiro Midoh, Koji Nakamae. The combinational or selective usage of the laser SQUID microscope, the non-bias laser terahertz emission microscope, and fault simulations in non-electrical-contact fault localization. MICROELECTRONICS RELIABILITY. 2011. 51. 9-11. 1624-1631
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二川 清, 山下 将嗣, 松本 徹, 三浦 克介, 御堂 義博, 中前 幸治. (招待講演)レーザSQUID顕微鏡、レーザテラヘルツ放射顕微鏡、関連シミュレーションの統合的/選択的利用. 電子情報通信学会信頼性研究会. 2011
Books (2)：
-
新版 LSI故障解析技術
日科技連出版社 2011
-
LSIの信頼性
日科技連出版社 2010
Professional career (1)：
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