Kimura Yoshihide

キムラヨシヒデ | Kimura Yoshihide

Affiliation and department：
Job title： Others

Research field (3)： Measurement engineering , Computational science , Thin-film surfaces and interfaces

Research keywords (6)：電子回路技術 , 真空技術 , 表面物性 , Electronics , Vacuum technology , Surface Sience

Research theme for competitive and other funds (6)：

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MISC (33)：

Aberration-free Phase Images of DNA Observed by Phase Transmission Electron Microscopy. 8th Asia-Pacific Conference on Electron Microscopy (8APEM)(Kanazawa, Japan, June 7-11, 2004), pp276-277. 2004. pp276-277
Acceleration Voltage Dependences of Irradiation Damage and Image Contrast in Transmission Electron Microscopy. 8th Asia-Pacific Conference on Electron Microscopy(8APEM)(Kanazawa, Japan, June 7-11, 2004)pp724-725. 2004. pp724-725
Acceleration Voltage Dependences of Irradiation Damage and Image Contrast in Transmission Electron Microscopy. 8th Asia-Pacific Conference on Electron Microscopy(8APEM)(Kanazawa, Japan, June 7-11, 2004)pp724-725. 2004. pp724-725
Study on Zr-Si/W(100) Surface at High Temperatures by Reflection High Energy Electron Diffraction. (共著). Japanese Jpurnal of Applied Physics. 1999. 38. 5A. 2951-2952
コインシデンス分光法の新しい展開 -分光法から分光顕微鏡法へ-. ぶんせき. 1998. 6. 411

ｍore...

Patents (2)：

特許第2884077号「能動型画像処理機能を有するCCD型固体撮像装置およびそれを用いた能動的画像処理装置」
Patent, 2884077, "CCD type Imaging Device with a function of Active Image processing and Equipment with the Imaging Device"

Works (5)：

Education (4)：

Professional career (2)：

Work history (2)：

Awards (1)：

Association Membership(s) (2)：

日本電子顕微鏡学会 , 応用物理学会

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