Rchr
J-GLOBAL ID：200901042584291616
Update date: Mar. 22, 2024
Atsushi Ogura
オグラ アツシ | Atsushi Ogura
Affiliation and department：
Job title：
Professor
Research field (1)：
Crystal engineering
Research theme for competitive and other funds (4)：
- 2014 - 2017 Energy strage system with recycled hydrogen carriers
- 2012 - 2017 Multi-axial analysis of strain states introduced in nano area on Ge and SiGe super-thin films by Raman spectroscopy
- 2008 - 2009 LSIプロセスによりシリコン結晶に導入された結晶歪の精密分布測定に関する研究
- 2007 - 2007 シリコン最表面の微小領域に導入された結晶歪の精密分布測定に関する研究
Papers (546)：
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Ryo Yokogawa, Sho Sugawa, Ichiro Yonenaga, Yasutomo Arai, Atsushi Ogura. Determination of Ge-fraction-shift coefficients for Raman spectroscopy in all vibration modes investigated by single-crystalline bulk SiGe and its application to strain evaluation in SiGe film grown on substrate. Japanese Journal of Applied Physics. 2024. 63. 3. 035503-035503
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Yuta Ito, Ryo Yokogawa, Wei-Chen Wen, Yuji Yamamoto, Takuya Minowa, Atsushi Ogura. Strain and optical characteristics analyses of three-dimentional self-ordered multilayered SiGe nanodots by photoluminescence and Raman spectroscopy. Japanese Journal of Applied Physics. 2024. 63. 3. 03SP31-03SP31
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S. Sugawa, R. Yokogawa, A. Ogura. Local thermal conductivity properties of a SiGe nanowire observed by laser power sweep Raman spectroscopy. Japanese Journal of Applied Physics. 2024. 63. 2. 02SP68-02SP68
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Ichiro Hirosawa, Kazutoshi Yoshioka, Ryo Yokogawa, Takeshi Watanabe, Atsushi Ogura. Strain distributions in carbon-doped silicon nanowires along [110] and [100] investigated by X-ray diffraction. Japanese Journal of Applied Physics. 2024
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Yuiha Maeda, Ryo Yokogawa, Sho Sugawa, Chia-Tsong Chen, Kasidit Toprasertpong, Mitsuru Takenaka, Shinichi Takagi, Atsushi Ogura. Evaluation of Anisotropic Biaxial Stress in Extremely-Thin Body (100) Silicon-Germanium-on-Insulator p-Type Metal-Oxide-Semiconductor Field-Effect-Transistor by Oil-Immersion Raman Spectroscopy. ECS Transactions. 2023. 112. 1. 37-43
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MISC (139)：
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井手康貴, 西原達平, 西原達平, 中村京太郎, 大下祥雄, 河津知之, 長井俊樹, 山田昇, 小林勇人, 小椋厚志, et al. Influence of Surface Texturing on Three-dimensional Flexibility of Single Crystalline Si Wafer. 応用物理学会春季学術講演会講演予稿集(CD-ROM). 2023. 70th
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原豊, 井手康貴, 西原達平, 中村京太郎, 大下祥雄, 河津知之, 長井俊樹, 山田昇, 宮下幸雄, 小椋厚志, et al. Influence of Surface Structure on Flexibility of Single Crystalline Si Wafer. 応用物理学会春季学術講演会講演予稿集(CD-ROM). 2022. 69th
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原豊, 横川凌, 横川凌, 西原達平, 中村京太郎, 大下祥雄, 河津知之, 長井俊樹, 山田昇, 宮下幸雄, et al. Slicing Damage Evaluation for Thin Si Solar Cells: III. 応用物理学会秋季学術講演会講演予稿集(CD-ROM). 2021. 82nd
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吉岡和俊, 小原田賢聖, 小笠原凱, 廣沢一郎, 渡辺剛, 横川凌, 横川凌, 小椋厚志, 小椋厚志. Triaxial Strain Evaluation for Mesa-structured Carbon-doped Silicon using X-ray Reciprocal Space Mapping. 応用物理学会春季学術講演会講演予稿集(CD-ROM). 2021. 68th
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松浦賢太朗, 濱田昌也, 濱田拓也, 谷川晴紀, 坂本拓朗, 堀敦, 宗田伊理也, 川那子高暢, 角嶋邦之, 筒井一生, et al. Normally-off Sputtered MoS2-nMISFETs for Large Scale Integration. 応用物理学会春季学術講演会講演予稿集(CD-ROM). 2020. 67th
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Books (9)：
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Advanced Aspects of Spectroscopy
InTech, Croatia 2012 ISBN:9789535107156
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表面・深さ方向の分析方法
サイエンス&テクノロジー 2007
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電子材料ハンドブック
朝倉書店 2006
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高周波半導体材料・デバイスの新展開
シーエムシー出版 2006
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最新シリコンデバイスと結晶技術
リアライズ理工センター 2005
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Lectures and oral presentations (267)：
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Characterictics variability of gate-all-around polycrystalline silicon nanowire transistors with width of 10nm scale
(2017 Silicon Nanoelectronics Workshop, SNW 2017 2017)
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Fabrication and performance analysis of a mechanical stack InGaP/GaAs//Si solar cell
(2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017 2017)
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A study on the evaluation method of glass frit paste for crystalline silicon solar cells
(2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017 2017)
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Effect of glass frit in metallization paste on the electrical losses in bifacial N-type crystalline silicon solar cells
(2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017 2017)
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Evaluation of SiNx passivation with plasma treatment for crystalline Si solar cell
(2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017 2017)
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