Formation Mechanism of Artificial Bright Spots in Atomic Resolution High-Angle Annular Dark Field STEM Images
8-th Conf. on Frontiers of Electron Microscopy in Materials Science 2000
HAADF-STEM Analysis of the Distribution of As Atoms Doped in Si Crystals
Proc. 3-rd Japan-Poland Joint Seminar 2000
Quantitative Comparison Analysis of Every Atomic Column in As-Implanted Si Crystals Using HAADF-STEM
Proc. of EUREM 2000
Formation Mechanism of Artificial Bright Spots in Atomic Resolution High-Angle Annular Dark Field STEM Images
8-th Conf. on Frontiers of Electron Microscopy in Materials Science 2000
HAADF-STEM Analysis of the Distribution of As Atoms Doped in Si Crystals
Proc. 3-rd Japan-Poland Joint Seminar 2000