Rchr
J-GLOBAL ID：200901061501753600
Update date: Sep. 13, 2022
Fujioka Hiromu
フジオカ ヒロム | Fujioka Hiromu
Homepage URL (1)：
http://www-ise3.ist.osaka-u.ac.jp
Research field (2)：
Electronic devices and equipment
, Intelligent informatics
Research keywords (2)：
知能情報学
, Intelligent Informatics
Research theme for competitive and other funds (6)：
知的画像処理に関する研究
集積回路生産テストシステムの評価
集積回路のテストに関する研究
Study on Intelligent Image Processing
Study on Evaluation of VLSI Manufacturing Test System
Study on VLSI Testing
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MISC (68)：
FUJIOKA Hiromu, NAKAMAE Koji. LSI Testing by Electron Beam Probe(<Special Issue> Charged Particle Beam Application to Precision Engineering). Journal of the Japan Society of Precision Engineering. 2001. 67. 9. 1407-1411
テスト工程の生産性・経済性向上のための方策. 進化する半導体組立・テスト工程, EDリサーチ社. 2001. 69-88
K Nakamae, Y Midoh, K Miura, H Fujioka. Boundary extraction in the SEM cross section of LSI. INTELLIGENT ROBOTS AND COMPUTER VISION XX: ALGORITHMS, TECHNIQUES, AND ACTIVE VISION. 2001. 4572. 451-458
Development of an EB/FIB integrated test system. Failure Physics and Analysis (ESREF 2001). 2001. 1489-1494
Fail Pattern Classification and Analysis System of Memory Fail Bit Maps. Proc. 4th International Conference on Modeling and Simulation of Microsystems. 2001. 598-601
ｍore...
Books (5)：
計算機システム-ハードウェアの基礎-
昭晃堂 2000
Computer System : Basics of Hardware
2000
電子顕微鏡で観るLSIの世界
日刊工業新聞社 1990
The LSI World Observed with Electron Microscope
1990
Electron Beam Testing
Academic Press, INC. (Advances in Electronics and Electron Physics) 1989
Professional career (2)：
Ph.D. in Engineering (Osaka University)
Master of Engineering (Osaka University)
Work history (1)：
Fukui University of Technology
Awards (1)：
1981 - 日本電子顕微鏡学会瀬藤賞
Association Membership(s) (4)：
IEEE(INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS)
, 日本電子顕微鏡学会
, 応用物理学会
, 電子情報通信学会
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