Rchr
J-GLOBAL ID:200901068815833467   Update date: Nov. 23, 2023

AKIMOTO Koichi

アキモト コウイチ | AKIMOTO Koichi
Affiliation and department:
Job title: Professor
Research field  (3): Semiconductors, optical and atomic physics ,  Crystal engineering ,  Thin-film surfaces and interfaces
Research keywords  (2): X-ray diffraction ,  Surface and interface physics
Research theme for competitive and other funds  (13):
  • 2015 - 2018 Study on strain fields and surface reconstructions of GaN crystals which have microstructure in mesoscopic scale.
  • 2013 - 2016 Analysis of precise electron density of topological insulator thin films by applying direct methods to surface X-ray diffraction
  • 2012 - 2015 Study on strain fields of GaN crystals which have microstructures in mesoscopic scale.
  • 2011 - 2013 Study on the correlation between the behavior of a soft metal layer at frictional interface and its tribological properties
  • 2009 - 2011 Study on crystal grains of GaN which has microstructures in mesoscopic scale.
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Papers (93):
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Patents (8):
Books (5):
  • 理工系の基礎物理学
    培風館 2016 ISBN:9784563025083
  • 表面科学の基礎と応用 : 日本表面科学会創立25周年記念
    エヌ・ティー・エス 2004 ISBN:4860430514
  • 結晶解析ハンドブック
    共立出版 1999 ISBN:4320033221
  • 応用物理用語大事典
    オーム社 1998 ISBN:4274023648
  • 表面分析図鑑
    共立出版 1994 ISBN:4320043227
Lectures and oral presentations  (14):
  • 22pGQ-2 Atomic structure of the Si(553)-Au surface
    (Meeting abstracts of the Physical Society of Japan 2010)
  • 22aXJ-10 Structural changes in the SiC(0001)-3×3 and (√<3>×√<3>)-R30°reconstructions due to exposure to oxygen
    (Meeting abstracts of the Physical Society of Japan 2007)
  • 26pXC-4 Three-dimensional study on Si(111)-6×1(3×1)-Ag surface structure using surface x-ray diffraction
    (Meeting Abstracts of the Physical Society of Japan 2005)
  • Development of a manipulator for surface X-ray diffraction measurement at low temperature and study of the Si(111)-6x1-Ag surface
    (Meeting abstracts of the Physical Society of Japan 2003)
  • Structural Study of SiC(0001)3×3 Surface by Surface X-Ray Diffraction
    (Meeting abstracts of the Physical Society of Japan 2002)
more...
Education (2):
  • - 1985 The University of Tokyo Graduate School, Division of Engineering
  • - 1980 The University of Tokyo Faculty of Engineering
Professional career (1):
  • 工学博士
Awards (1):
  • 2008 - 2007年度JJAP編集貢献賞
Association Membership(s) (4):
表面科学会 ,  日本物理学会 ,  応用物理学会 ,  American Physical Society
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