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J-GLOBAL ID：200902000021740146   Reference number：91A0600926

Raman and Far Infrared Diagnostics of Semiconductor Superlattices.

Author (9)： DUMELOW T (Royal Holloway and Bedford New Coll., Surrey, GBR) ,  HAMILTON A A (Royal Holloway and Bedford New Coll., Surrey, GBR) ,  PARKER T J (Royal Holloway and Bedford New Coll., Surrey, GBR) ,  SAMSON B (Univ. Essex, Colchester, GBR) ,  SMITH S R P (Univ. Essex, Colchester, GBR) ,  TILLEY D R (Univ. Essex, Colchester, GBR) ,  FOXON C T B (Philips Research Lab., Surrey, GBR) ,  HARRIS J J (Philips Research Lab., Surrey, GBR) ,  MOORE K J (Philips Research Lab., Surrey, GBR)
Material： Conference Proceedings. IEEE LEOS Annual Meeting (IEEE Lasers and Electro-Optics Society)  (Lasers and Electro-Optics Society Annual Meeting Conference Proceedings)
Volume： 3rd  Issue： Digest  Page： 320  Publication year： 1990 
JST Material Number： T0931A  ISSN： 1092-8081  Document type： Proceedings
Country of issue： United States (USA)  Language： ENGLISH (EN)