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ArticleJ-GLOBAL ID:200902000039458367整理番号:92A0283748

A Comparative Study of the Effects of Dynamic Stressing on High-field Endurance and Stability of Reoxidized-Nitrided, Fluorinated and Conventional Oxides.

再酸化‐窒化,ふっ素処理と従来の酸化物の高電界耐性と安定性における動的ストレス印加効果の比較研究

著者:LIU Z H(Univ. California, CA, USA)、ROSENBAUM E(Univ. California, CA, USA)、KO P K(Univ. California, CA, USA)・・・
資料名:Tech Dig Int Electron Devices Meet 巻:1991 ページ:723-726
発行年:1991年
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About J-GLOBAL

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