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J-GLOBAL ID:200902000044108323   Reference number:82A0120908

A study of the point-defect mobility in Ag-Cu by high-voltage electron microscopy.

高圧電子顕微鏡によるAg-Cuにおける点欠陥移動度の研究
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Volume: 67  Issue:Page: 347-359  Publication year: Sep. 1981 
JST Material Number: D0774A  ISSN: 0031-8965  Document type: Article
Article type: 原著論文  Country of issue: Germany, Federal Republic of (DEU)  Language: ENGLISH (EN)
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Irradiational changes of metals  ,  Diffusion in metals  ,  Lattice defects in metals 
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