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J-GLOBAL ID:200902000075083558   Reference number:90A0278043

Investigation of SimGen strained monolayer superlattices by RHEED, Raman, and X-ray techniques.

RHEED,Raman,X線を用いたSimGenひずみ単層超格子の研究
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Volume: 183  Page: 57-63  Publication year: Dec. 30, 1989 
JST Material Number: B0899A  ISSN: 0040-6090  Document type: Article
Article type: 原著論文  Country of issue: Netherlands (NLD)  Language: ENGLISH (EN)
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半導体-半導体接触【’81~’92】  ,  Semiconductor thin films 
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