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ArticleJ-GLOBAL ID:200902000112540557整理番号:83A0061192

Sensitivity calculations for multielemental trace analysis by synchrotron radiation induced X-ray fluorescence.

シンクロトロン放射誘起X線けい光による多元素こん跡分析に対する感度計算

著者:GORDON B M(Brookhaven National Lab., NY)
資料名:Nucl Instrum Methods Phys Res 巻:204 号:1 ページ:223-229
発行年:1982年12月15日
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