Art
J-GLOBAL ID：200902000172615378   Reference number：87A0543161

Reliability of an electronic assembly: A case history.

電子回路組立の信頼性 事例史
Author (1)：
HART L

About HART L

(IBM Corp., NC, USA)

About IBM Corp., NC, USA


Material：
IEEE Transactions on Reliability  (IEEE Trans Reliab)

About IEEE Transactions on Reliability


Volume： 36  Issue： 4  Page： 385-389  Publication year： Oct. 1987 
JST Material Number： C0448A  ISSN： 0018-9529  CODEN： IERQAD  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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printed board

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,...
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Thesaurus term/Semi thesaurus term
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All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
accelerated test

About accelerated test


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JST classification (2)：
JST classification
Category name(code) classified by JST.
Measurement,testing and reliability of solid-state devices 
(NC03040G)

About Measurement,testing and reliability of solid-state devices

,  Reliability 
(KB04040H)

About Reliability

Terms in the title (3)：
Terms in the title
Keywords automatically extracted from the title.
電子回路

About 電子回路

, 
組立

About 組立

, 
事例史

About 事例史


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