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J-GLOBAL ID:200902000174402169   Reference number:92A0017377

Correlation Between Electrical and Structural Characterization of In0.53Ga0.47As/Si3N4 Interfaces on MIS Structures.

MIS構造上のIn0.53Ga0.47As/Si3N4界面の電気的および構造的特性の相互関係
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Volume: 138  Issue: 11  Page: 3470-3473  Publication year: Nov. 1991 
JST Material Number: C0285A  ISSN: 1945-7111  CODEN: JESOAN  Document type: Article
Article type: 原著論文  Country of issue: United States (USA)  Language: ENGLISH (EN)
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金属-絶縁体-半導体構造【’81~’92】 
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