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ArticleJ-GLOBAL ID:200902001838993700整理番号:84A0287351

Thermally stimulated current measurements on irradiated MOS capacitors.

照射されたMOSキャパシタの熱刺激電流測定

著者:SHANFIELD Z(Northrop, CA)
資料名:IEEE Trans Nucl Sci 巻:30 号:6 ページ:4064-4070
発行年:1983年12月
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