Art
J-GLOBAL ID：200902001840717532   Reference number：81A0090273

“Ultra-clean” X-ray spectra in the jeol JEM-100CX.

JEOL JEM-100CXでの“超明確な”X線スペクトル
Author (4)：
BLAKE D F

About BLAKE D F

(Univ. Michigan)

About Univ. Michigan

, 
ALLARD L F

About ALLARD L F

(Univ. Michigan)

About Univ. Michigan

, 
PEACOR D R

About PEACOR D R

(Univ. Michigan)

About Univ. Michigan

, 
BIGELOW W C

About BIGELOW W C

(Univ. Michigan)

About Univ. Michigan


Material：
Proceedings. Annual Meeting. Electron Microscopy Society of America  (Proc Annu Meet Electron Microsc Soc Am)

About Proceedings. Annual Meeting. Electron Microscopy Society of America


Volume： 38th  Page： 136-137  Publication year： 1980 
JST Material Number： A0878B  Document type： Proceedings
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
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X-ray analysis

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,...
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JST classification (1)：
JST classification
Category name(code) classified by JST.
Other phsical analysis 
(CC03014E)

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Terms in the title (2)：
Terms in the title
Keywords automatically extracted from the title.
JEM

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, 
X線スペクトル

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