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ArticleJ-GLOBAL ID:200902001854882668整理番号:85A0331728

Secondary ion mass spectroscopy for bulk and surface analysis of particulate contaminants.

微粒子汚染物のバルクおよび表面分析の二次イオン質量分析

著者:GAVRILOVIC J(Walter C. McCrone Assoc. Inc., Illinois)
資料名:Solid State Technol 巻:28 号:4 ページ:299-302
発行年:1985年04月
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J-GLOBAL: Linking, Expanding and Sparking

About J-GLOBAL

Linking

J-GLOBAL links information that represents the key to research and development. For example, linking articles and patents with people (authors and inventors) enables the extraction of a sequence of information.
It’s useful for making new discoveries and uncovering new information.

Expanding

The system enables searches of similar kinds of content through linkage with external sites.
It helps you to obtain knowledge from dissimilar fields and discover concepts that cross the boundaries of specialisms.

Sparking

Through repeated linkage and expansioniteration, J-GLOBAL provides unexpected hints for problem-solving and the illumination of new ideas.