Art
J-GLOBAL ID：200902001854882668   Reference number：85A0331728

Secondary ion mass spectroscopy for bulk and surface analysis of particulate contaminants.

微粒子汚染物のバルクおよび表面分析の二次イオン質量分析
Author (1)：
GAVRILOVIC J

About GAVRILOVIC J

(Walter C. McCrone Assoc. Inc., Illinois)

About Walter C. McCrone Assoc. Inc., Illinois


Material：
Solid State Technology  (Solid State Technol)

About Solid State Technology


Volume： 28  Issue： 4  Page： 299-302  Publication year： Apr. 1985 
JST Material Number： E0226A  ISSN： 0038-111X  Document type： Article
Article type： 解説  Country of issue： United States (USA)  Language： ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
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pollution by particulate matter

About pollution by particulate matter

,...
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JST classification (2)：
JST classification
Category name(code) classified by JST.
Measurement,testing and reliability of solid-state devices 
(NC03040G)

About Measurement,testing and reliability of solid-state devices

,  Mass spectrometry 
(CC03013N)

About Mass spectrometry

Terms in the title (4)：
Terms in the title
Keywords automatically extracted from the title.
微粒子汚染

About 微粒子汚染

, 
バルク

About バルク

, 
表面分析

About 表面分析

, 
二次イオン質量分析

About 二次イオン質量分析


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