Art
J-GLOBAL ID：200902001860920334   Reference number：87A0009294

X-ray fluorescence analysis of multi-layer thin films.

多層薄膜の蛍光X線分析
Author (2)：
HUANG T C

About HUANG T C

(IBM Almaden Research Center, CA, USA)

About IBM Almaden Research Center, CA, USA

, 
PARRISH W

About PARRISH W

(IBM Almaden Research Center, CA, USA)

About IBM Almaden Research Center, CA, USA


Material：
Advances in X-Ray Analysis  (Adv X-Ray Anal)

About Advances in X-Ray Analysis


Volume： 29  Page： 395-402  Publication year： 1986 
JST Material Number： H0119C  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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All keywords is available on JDreamIII(charged).
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X-ray fluorescence analysis

About X-ray fluorescence analysis

,...
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JST classification (2)：
JST classification
Category name(code) classified by JST.
Physical analysis of metals and alloys 
(CC03040V)

About Physical analysis of metals and alloys

,  Metallic thin films 
(BK14030T)

About Metallic thin films

Terms in the title (2)：
Terms in the title
Keywords automatically extracted from the title.
多層薄膜

About 多層薄膜

, 
蛍光X線分析

About 蛍光X線分析


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