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ArticleJ-GLOBAL ID:200902001874979072整理番号:89A0478892

通信機器に適用する耐雷試験回路

Lightning surge test circuit for telecommunication equipment.

著者:桑原伸夫(NTT 通信網総研)、元満民生(NTT ネットワークシステム開セ)、井手口健(NTT 通信網総研)
資料名:NTT R D 巻:38 号:6 ページ:691-700
発行年:1989年06月
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J-GLOBAL: Linking, Expanding and Sparking

About J-GLOBAL

Linking

J-GLOBAL links information that represents the key to research and development. For example, linking articles and patents with people (authors and inventors) enables the extraction of a sequence of information.
It’s useful for making new discoveries and uncovering new information.

Expanding

The system enables searches of similar kinds of content through linkage with external sites.
It helps you to obtain knowledge from dissimilar fields and discover concepts that cross the boundaries of specialisms.

Sparking

Through repeated linkage and expansioniteration, J-GLOBAL provides unexpected hints for problem-solving and the illumination of new ideas.