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ArticleJ-GLOBAL ID:200902001880187447整理番号:89A0500236

EFI: Expert fault isolation, a practical approach.

EFI 実用的アプローチとしてのボードテストにおけるエキスパート故障分離

著者:SMITH D A(Computer Automation, Inc., CA, USA)
資料名:Proc Tech Program Natl Electron Packag Prod Conf 巻:1989 号:West Vol.1 ページ:909-918
発行年:1989年
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J-GLOBAL: Linking, Expanding and Sparking

About J-GLOBAL

Linking

J-GLOBAL links information that represents the key to research and development. For example, linking articles and patents with people (authors and inventors) enables the extraction of a sequence of information.
It’s useful for making new discoveries and uncovering new information.

Expanding

The system enables searches of similar kinds of content through linkage with external sites.
It helps you to obtain knowledge from dissimilar fields and discover concepts that cross the boundaries of specialisms.

Sparking

Through repeated linkage and expansioniteration, J-GLOBAL provides unexpected hints for problem-solving and the illumination of new ideas.