Art
J-GLOBAL ID：200902001880781357   Reference number：85A0044494

Bayesian models of tests - Some practical results.

試験のベイズモデル 実際の結果
Author (2)：
SMALL M

About SMALL M

(International Computers Ltd., England)

About International Computers Ltd., England

, 
MURRAY D

About MURRAY D

(International Computers Ltd., England)

About International Computers Ltd., England


Material：
Proceedings. International Test Conference  (Proc Int Test Conf)

About Proceedings. International Test Conference


Volume： 1983  Page： 652-658  Publication year： 1983 
JST Material Number： E0211B  ISSN： 1089-3539  Document type： Proceedings
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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automatic test

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,...
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JST classification (1)：
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Methods and instruments for measuring other electromagnetic quantities 
(AD07070F)

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Terms in the title (2)：
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試験

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, 
ベイズモデル

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