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ArticleJ-GLOBAL ID:200902001882492280整理番号:89A0060253

3.1 GeV-xenon ion latent tracks in Bi2Fe4O9: Moessbauer and electron microscopy studies.

Bi2Fe4O9中の3.1GeV‐キセノンイオンの潜跡 Moessbauer法と電子顕微鏡による研究

著者:GROULT D(ISMRA, Caen, FRA)、HERVIEU M(ISMRA, Caen, FRA)、NGUYEN N(ISMRA, Caen, FRA)・・・
資料名:J Solid State Chem 巻:76 号:2 ページ:248-259
発行年:1988年10月
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