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ArticleJ-GLOBAL ID:200902001898105340整理番号:86A0449304

Fundamental ion beam sputtering characteristics for high resolution electron microscopy.

高分解能電子顕微鏡のためのイオンビームスパッタリングの基礎特性

著者:KANAYA K(Kogakuin Univ., Tokyo)、BABA N(Kogakuin Univ., Tokyo)、MURANAKA Y(Hamamatsu Univ. School of Medicine)・・・
資料名:工学院大学研究報告 号:60 ページ:74-80
発行年:1986年04月
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J-GLOBAL: Linking, Expanding and Sparking

About J-GLOBAL

Linking

J-GLOBAL links information that represents the key to research and development. For example, linking articles and patents with people (authors and inventors) enables the extraction of a sequence of information.
It’s useful for making new discoveries and uncovering new information.

Expanding

The system enables searches of similar kinds of content through linkage with external sites.
It helps you to obtain knowledge from dissimilar fields and discover concepts that cross the boundaries of specialisms.

Sparking

Through repeated linkage and expansioniteration, J-GLOBAL provides unexpected hints for problem-solving and the illumination of new ideas.