Art
J-GLOBAL ID：200902001905420001   Reference number：90A0076149

Study of the structure and chemistry of point, line and planar imperfections via field-ion and atom-probe field-ion microscopy.

電界イオンと原子プローブ電界イオン顕微鏡を用いた点,線,平状欠陥の構造と化学の研究
Author (1)：
SEIDMAN D N

About SEIDMAN D N

(Northwestern Univ., Illinois, USA)

About Northwestern Univ., Illinois, USA


Material：
Characterization of the Structure and Chemistry of Defects in Materials  (Charact Struct Chem Defects Mater)

About Characterization of the Structure and Chemistry of Defects in Materials


Page： 315-328  Publication year： 1989 
JST Material Number： K19890582  ISBN： 1-55899-011-9  Document type： Proceedings
Article type： 文献レビュー  Country of issue： United States (USA)  Language： ENGLISH (EN)
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atom-probe FIM

About atom-probe FIM

,...
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Thesaurus term/Semi thesaurus term
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On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
FIM【顕微鏡】

About FIM【顕微鏡】


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JST classification (1)：
JST classification
Category name(code) classified by JST.
Experimental techniques of observation of lattice defects 
(BK12020U)

About Experimental techniques of observation of lattice defects

Terms in the title (6)：
Terms in the title
Keywords automatically extracted from the title.
電界

About 電界

, 
イオン

About イオン

, 
原子プローブ電界イオン顕微鏡

About 原子プローブ電界イオン顕微鏡

, 
欠陥

About 欠陥

, 
化学

About 化学

, 
研究

About 研究


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