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ArticleJ-GLOBAL ID:200902001909053550整理番号:84A0382245

High-temperature wafer prober predicts yield problems early.

歩留り問題を早期に予測する高温ウエハプローバ

著者:BUOL D A(Texas Instruments Inc.)
資料名:Electronics 巻:57 号:9 ページ:141-144
発行年:1984年05月03日
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About J-GLOBAL

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