Art
J-GLOBAL ID：200902001909053550   Reference number：84A0382245

High-temperature wafer prober predicts yield problems early.

歩留り問題を早期に予測する高温ウエハプローバ
Author (1)：
BUOL D A

About BUOL D A

(Texas Instruments Inc.)

About Texas Instruments Inc.


Material：
Electronics

About Electronics


Volume： 57  Issue： 9  Page： 141-144  Publication year： May. 03, 1984 
JST Material Number： B0455B  ISSN： 0013-5070  CODEN： ELECA  Document type： Article
Article type： 解説  Country of issue： United States (USA)  Language： ENGLISH (EN)
Thesaurus term：
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wafer

About wafer

,...
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JST classification (1)：
JST classification
Category name(code) classified by JST.
Measurement,testing and reliability of solid-state devices 
(NC03040G)

About Measurement,testing and reliability of solid-state devices

Terms in the title (3)：
Terms in the title
Keywords automatically extracted from the title.
歩留り

About 歩留り

, 
早期

About 早期

, 
予測

About 予測


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