Art
J-GLOBAL ID：200902001933275203   Reference number：82A0196131

Survey of approaches to testing and diagnosing microprocessor-based systems.

マイクロプロセッサ利用システムの試験と診断へのアプローチの展望
Author (2)：
SCHMITT W

About SCHMITT W

(Mantech International Corp.)

About Mantech International Corp.

, 
LYNCH E

About LYNCH E

(Mantech International Corp.)

About Mantech International Corp.


Material：
IEEE AUTOTESTCON  (International Automatic Testing Conference)

About IEEE AUTOTESTCON


Volume： 1980  Page： 127-130  Publication year： 1980 
JST Material Number： D0707A  ISSN： 1088-7725  Document type： Proceedings
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
microprocessor

About microprocessor

,...
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JST classification (2)：
JST classification
Category name(code) classified by JST.
Methods and instruments for measuring other electromagnetic quantities 
(AD07070F)

About Methods and instruments for measuring other electromagnetic quantities

,  Electric and electronic parts in general 
(NA05010H)

About Electric and electronic parts in general

Terms in the title (4)：
Terms in the title
Keywords automatically extracted from the title.
マイクロプロセッサ

About マイクロプロセッサ

, 
試験

About 試験

, 
診断

About 診断

, 
展望

About 展望


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