Art
J-GLOBAL ID：200902001939463567   Reference number：89A0374290

IC quality and test transparency.

ICの品質と試験の透明性
Author (2)：
MCCLUSKEY E J

About MCCLUSKEY E J

(Stanford Univ., CA, USA)

About Stanford Univ., CA, USA

, 
BUELOW F

About BUELOW F

(Teradyne, Inc., CA, USA)

About Teradyne, Inc., CA, USA


Material：
IEEE Transactions on Industrial Electronics  (IEEE Trans Ind Electron)

About IEEE Transactions on Industrial Electronics


Volume： 36  Issue： 2  Page： 197-202  Publication year： May. 1989 
JST Material Number： C0234A  ISSN： 0278-0046  CODEN： ITIED6  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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digital integrated circuit

About digital integrated circuit

,...
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JST classification (1)：
JST classification
Category name(code) classified by JST.
Measurement,testing and reliability of solid-state devices 
(NC03040G)

About Measurement,testing and reliability of solid-state devices

Terms in the title (3)：
Terms in the title
Keywords automatically extracted from the title.
IC

About IC

, 
試験

About 試験

, 
透明性

About 透明性


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