Art
J-GLOBAL ID：200902001948013159   Reference number：83A0468619

Contactless measurement of Schottky barrier heights using secondary electrons.

二次電子を用いたSchottky障壁高さの非接触測定
Author (2)：
HUANG H-C W

About HUANG H-C W

(IBM, New York)

About IBM, New York

, 
HO P S

About HO P S

(IBM, New York)

About IBM, New York


Material：
Applied Physics Letters  (Appl Phys Lett)

About Applied Physics Letters


Volume： 41  Issue： 5  Page： 482-484  Publication year： Sep. 01, 1982 
JST Material Number： H0613A  ISSN： 0003-6951  CODEN： APPLAB  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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Schottky barrier

About Schottky barrier

,...
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JST classification (1)：
JST classification
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半導体-金属接触【’81~’92】 
(BM03073E)

About 半導体-金属接触【’81~’92】

Terms in the title (3)：
Terms in the title
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二次電子

About 二次電子

, 
Schottky障壁高さ

About Schottky障壁高さ

, 
非接触測定

About 非接触測定


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