X-Ray Diagnostics of 2D Deformation Profiles in Crystals with Periodically Distorted Near-Surface Region.

GOUREEV T E; NIKULIN A YU; PETRASHEN P V

Art

J-GLOBAL ID：200902001967062667 Reference number：92A0428079

X-Ray Diagnostics of 2D Deformation Profiles in Crystals with Periodically Distorted Near-Surface Region.

周期的に変形した近表面領域を持つ結晶の二次元ひずみ分布のX線診断

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Material：
Volume： 130 Issue： 2 Page： 263-271 Publication year： Apr. 1992
JST Material Number： D0774A ISSN： 0031-8965 Document type： Article
Article type：原著論文 Country of issue： Germany, Federal Republic of (DEU) Language： ENGLISH (EN)

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X-ray diffraction methods , Irradiational changes semiconductors

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