About J-GLOBAL

日本語

Font size
  • A
  • A

Articleの詳細情報

ArticleJ-GLOBAL ID:200902001973125018整理番号:87A0505705

Negative-U defect: Interstitial boron in silicon.

負の2電子捕獲U欠陥 シリコン内の格子間ほう素

著者:HARRIS R D(Lehigh Univ., PA, USA)、NEWTON J L(Lehigh Univ., PA, USA)、WATKINS G D(Lehigh Univ., PA, USA)
資料名:Phys Rev B Condens Matter Mater Phys 巻:36 号:2 ページ:1094-1104
発行年:1987年07月15日
  • J-GLOBAL home
  • Bookmark J-GLOBAL

J-GLOBAL: Linking, Expanding and Sparking

About J-GLOBAL

Linking

J-GLOBAL links information that represents the key to research and development. For example, linking articles and patents with people (authors and inventors) enables the extraction of a sequence of information.
It’s useful for making new discoveries and uncovering new information.

Expanding

The system enables searches of similar kinds of content through linkage with external sites.
It helps you to obtain knowledge from dissimilar fields and discover concepts that cross the boundaries of specialisms.

Sparking

Through repeated linkage and expansioniteration, J-GLOBAL provides unexpected hints for problem-solving and the illumination of new ideas.