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ArticleJ-GLOBAL ID:200902001981554599整理番号:88A0458369

ランダムパターンを用いた半導体メモリテストの故障検出率の解析

Analysis of detection probability of semiconductor random access memories in applying random patterns.

著者:玉本英夫(秋田大 鉱山)、大高達美(秋田大 鉱山)、成田裕一(秋田大 鉱山)
資料名:電子情報通信学会技術研究報告 巻:88 号:42 ページ:33-40(FTS88-6)
発行年:1988年05月26日
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About J-GLOBAL

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