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ArticleJ-GLOBAL ID:200902001982197587整理番号:83A0339292

Application of proton induced X-ray emission (PIXE) technique to gunshot residue analyses and other crime related problems.

射撃の残留物やその他の犯罪関連問題へのプロトン励起X線発光(PIXE)法の適用

著者:Sen P(Saha Inst. Nuclear Physics, India)、MEHTA G K(I.I.T., India)
資料名:IEEE Trans Nucl Sci 巻:30 号:2 ページ:1302-1304
発行年:1983年04月
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