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ArticleJ-GLOBAL ID:200902001984909363整理番号:92A0229481

シンクロトロン放射光利用広域X線吸収微細構造(SR‐EXAFS)解析

Analysis of synchrotron radiation extended X-ray absorption fine structure (SR-EXAFS).

著者:若木政利(日立 日立研)
資料名:表面技術 巻:43 号:3 ページ:188-193
発行年:1992年03月
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