Void growth as a function of residual stress level in thin, narrow aluminum lines.

KORHONEN M A; BORGESEN P; PASZKIET C A; LEE J K; LI C-Y

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J-GLOBAL ID：200902001993007720 Reference number：92A0281597

Void growth as a function of residual stress level in thin, narrow aluminum lines.

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Author (5)： , , , ,
Material：
Page： 413-418 Publication year： 1991
JST Material Number： K19920025 ISBN： 1-55899-120-4 Document type： Proceedings
Country of issue： United States (USA) Language： ENGLISH (EN)

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