Art
J-GLOBAL ID：200902002003300930   Reference number：88A0427690

Scale dependence of resistance fluctuations at metal-semiconductor junctions.

金属-半導体接合の抵抗のゆらぎの寸法依存性
Author (2)：
BOUDVILLE W J

About BOUDVILLE W J

(California Inst. Technology, CA, USA)

About California Inst. Technology, CA, USA

, 
MCGILL T C

About MCGILL T C

(California Inst. Technology, CA, USA)

About California Inst. Technology, CA, USA


Material：
Journal of Applied Physics  (Journal of General Physics and its Application to Other Sciences and to Industry)

About Journal of Applied Physics


Volume： 63  Issue： 10  Page： 5009-5014  Publication year： May. 15, 1988 
JST Material Number： C0266A  ISSN： 0021-8979  CODEN： JAPIAU  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
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metal-semiconductor junction

About metal-semiconductor junction

,...
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JST classification (1)：
JST classification
Category name(code) classified by JST.
半導体-金属接触【’81~’92】 
(BM03073E)

About 半導体-金属接触【’81~’92】

Terms in the title (3)：
Terms in the title
Keywords automatically extracted from the title.
半導体接合

About 半導体接合

, 
ゆらぎ

About ゆらぎ

, 
寸法依存性

About 寸法依存性


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