Art
J-GLOBAL ID:200902002004265178   Reference number:85A0015095

Optimization of high brightness Cs ion source and ion optics for UHV-IMMA.

超高真空イオンマイクロプローブ質量分析計のための高輝度Csイオン源及びイオン光学系の最適化
Author (4):
Material:
Page: 124-126  Publication year: 1984 
JST Material Number: K19840471  ISBN: 0-387-13316-X  Document type: Proceedings
Article type: 短報  Country of issue: Germany, Federal Republic of (DEU)  Language: ENGLISH (EN)
Thesaurus term:
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
,...
Semi thesaurus term:
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.

   To see more with JDream III (charged).   {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=85A0015095&from=J-GLOBAL&jstjournalNo=K19840471") }}
JST classification (4):
JST classification
Category name(code) classified by JST.
Mass spectrometry  ,  Analytical instruments  ,  Mass spectrometers  ,  Surface structure of solids in general 

Return to Previous Page