Art
J-GLOBAL ID：200902002018469248   Reference number：82A0043776

Monte carlo calculations based on the generalized electromigration failure model.

一般的エレクトロマイグレーション故障モデルに基づくモンテカルロ計算
Author (1)：
NIKAWA K

About NIKAWA K

(Nippon Electric Co., Ltd., Kawasaki-city)

About Nippon Electric Co., Ltd., Kawasaki-city


Material：
Annual Proceedings. IEEE International Reliability Physics Symposium  (IRPS)

About Annual Proceedings. IEEE International Reliability Physics Symposium


Volume： 19th  Page： 175-181  Publication year： 1981 
JST Material Number： A0631A  ISSN： 1541-7026  Document type： Proceedings
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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integrated circuit

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,...
Semi thesaurus term：
Thesaurus term/Semi thesaurus term
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All keywords is available on JDreamIII(charged).
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migration

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JST classification (2)：
JST classification
Category name(code) classified by JST.
Measurement,testing and reliability of solid-state devices 
(NC03040G)

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,  General 
(NC03161C)

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Terms in the title (4)：
Terms in the title
Keywords automatically extracted from the title.
エレクトロマイグレーション

About エレクトロマイグレーション

, 
故障モデル

About 故障モデル

, 
モンテカルロ

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, 
計算

About 計算


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