Art
J-GLOBAL ID：200902002023861466   Reference number：82A0089630

Evaluation of the surface photovoltage method of minority-carrier diffusion-length measurement.

少数キャリア拡散長測定の表面光起電力法の評価
Author (2)：
ALAM M K

About ALAM M K

(Univ. Queensland, Australia)

About Univ. Queensland, Australia

, 
YEOW Y T

About YEOW Y T

(Univ. Queensland, Australia)

About Univ. Queensland, Australia


Material：
Solid-State Electronics  (Solid-State Electron)

About Solid-State Electronics


Volume： 24  Issue： 12  Page： 1117-1119  Publication year： Dec. 1981 
JST Material Number： H0225A  ISSN： 0038-1101  Document type： Article
Article type： 短報  Country of issue： United Kingdom (GBR)  Language： ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
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impurity diffusion

About impurity diffusion

,...
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JST classification (2)：
JST classification
Category name(code) classified by JST.
Diffusion in solids in general 
(BL06021L)

About Diffusion in solids in general

,  Solic-state devices in general 
(NC03010Z)

About Solic-state devices in general

Terms in the title (4)：
Terms in the title
Keywords automatically extracted from the title.
少数キャリア

About 少数キャリア

, 
拡散長

About 拡散長

, 
表面光起電力

About 表面光起電力

, 
評価

About 評価


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