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ArticleJ-GLOBAL ID:200902002023861466整理番号:82A0089630

Evaluation of the surface photovoltage method of minority-carrier diffusion-length measurement.

少数キャリア拡散長測定の表面光起電力法の評価

著者:ALAM M K(Univ. Queensland, Australia)、YEOW Y T(Univ. Queensland, Australia)
資料名:Solid-State Electron 巻:24 号:12 ページ:1117-1119
発行年:1981年12月
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