Art
J-GLOBAL ID：200902002037253043
Reference number：90A0868762
Grazing incidenec diffraction of X-rays in semiconductor heterosturctures: application of the integral mode.
半導体ヘテロ構造におけるX線のすれすれ入射回折 積分モードの応用
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Author (2)：
,
Material：
Volume：
80
Issue：
3
Page：
347-352
Publication year：
Aug. 1990
JST Material Number：
H0611A
ISSN：
0722-3277
CODEN：
ZPBBDJ
Document type：
Article
Article type：
原著論文
Country of issue：
Germany, Federal Republic of (DEU)
Language：
ENGLISH (EN)
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JST classification (2)：
JST classification
Category name(code) classified by JST.
半導体-半導体接触【’81~’92】
, X-ray diffraction methods
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