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ArticleJ-GLOBAL ID:200902002047845674整理番号:91A0563511

Poly‐Si TFTにおける粒界トラップ準位密度の評価 (II)

Estimation of grain-boundary trap state density in poly-Si TFT. (II).

著者:加藤典司(富士ゼロックス)、山田想(富士ゼロックス)、西原義雄(富士ゼロックス)・・・
資料名:応用物理学関係連合講演会講演予稿集 巻:38th 号:Pt 2 ページ:675
発行年:1991年03月
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