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ArticleJ-GLOBAL ID:200902002054813036整理番号:89A0520886

Applications of slow positron beams to study point defect distributions near solid surfaces.

固体表面近傍の点欠陥分布の研究への低速陽電子ビームの応用

著者:VEHANEN A(Helsinki Univ. Technology, Espoo, FIN)
資料名:Hyperfine Interactions 巻:45 号:1/4 ページ:179-197
発行年:1989年03月
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About J-GLOBAL

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