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ArticleJ-GLOBAL ID:200902002061972867整理番号:90A0366617

Electro-optic measurement techniques for picosecond materials, devices, and integrated circuits.

ピコ秒物質,素子および集積回路の電気光学測定法

著者:VALDMANIS J A(Univ. Michigan, Michigan)
資料名:Semicond Semimet 巻:28 ページ:135-219
発行年:1990年
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About J-GLOBAL

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